Secondary Ion Mass Spectrometry: Applications For Depth Prof…

Secondary Ion Mass Spectrometry: Applications For Depth Prof…

USD 65.61 USD
SKU: l1lWLu2O
GTIN: 9781606505885
Condition: Brand New

Specifications

ISBN9781606505885
PublisherMomentum Press
Item Length9 in
Publication Year2015
TypeTextbook
FormatTrade Paperback
LanguageEnglish
Item Height0.6 in
AuthorFred Stevie
Item Weight23.5 Oz
Item Width6 in
Number Of Pages150 Pages

This textbook covers everything from the fundamentals to more specialized topics.

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